Exploration of Graphene

Description
"This thesis describes progress towards ultrafast electron diffraction experiments with which we will study ultrathin materials such as graphene and hexagonal boron nitride. We focus on the sample preparation and characterization of graphene. We outline the preparation process and explain the steps we take to transfer a clean sample across many different substrates. We have developed a method for estimating the sample thickness while the graphite is on a silicon wafer topped by a thin layer of silicon dioxide. We have studied the systematic error that accompanies this process and cross checked its accuracy by directly measuring sample thickness using atomic force microscopy. While there is further work to do on this technique, we have demonstrated that we can approximate the thickness of graphite samples such that we could identify relatively thin samples to then further characterize using more direct methods. This research will continue to advance our progress towards studying ultrathin materials using ultrafast electron diffraction."

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